Свежие наборы данных и обновления данных из разных источников со всего мира
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Historical versions of this dataset since 10 июля 2014 are available [view history].
Description
The OECD's Directorate for Science, Technology and Industry has developed patent data and indicators that are suitable for statistical analysis and that can help addressing S&T policy issues.
To date, the OECD Patent Database fully covers:
EPO and PCT patent counts are based on data received from the EPO (EPO Bibliographic database, patent published until November 2015). Series on USPTO patents and Triadic patent families are mainly derived from EPO's Worldwide Statistical Patent Database (PATSTAT, Autumn 2015). Regional data are based on OECD, REGPAT database, February 2016.
Indicators based on patent families improve the international comparability and the quality of patent's indicators (overcoming the drawbacks of traditional patent-based indicators, such as the "home advantage")
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